The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 10, 2022

Filed:

Sep. 01, 2020
Applicant:

Auris Health, Inc., Redwood City, CA (US);

Inventors:

Chauncey F. Graetzel, Palo Alto, CA (US);

Subashini Srinivasan, San Carlos, CA (US);

Yuriy Malinin, Palo Alto, CA (US);

Shyamprasad Konduri, Belmont, CA (US);

Assignee:

Auris Health, Inc., Redwood City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 34/20 (2016.01); G16H 40/63 (2018.01); G16H 70/20 (2018.01); G16H 40/40 (2018.01); G16H 20/00 (2018.01); A61B 34/10 (2016.01); A61B 34/30 (2016.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
A61B 34/20 (2016.02); G06N 20/00 (2019.01); G16H 40/40 (2018.01); G16H 40/63 (2018.01); G16H 70/20 (2018.01); A61B 2034/105 (2016.02); A61B 2034/2051 (2016.02); A61B 2034/301 (2016.02); A61B 2034/302 (2016.02); A61B 2034/303 (2016.02);
Abstract

Systems and methods for electromagnetic (EM) distortion detection and compensation are disclosed. In one aspect, the system includes an instrument, the system configured to: determine a reference position of the distal end of the instrument at a first time based on EM location data, determine that the distal end of the instrument at a second time is static, and determine that the EM location data at the second time is indicative of a position of the distal end of the instrument having changed from the reference position by greater than a threshold distance. The system is further configured to: determine a current offset based on the distance between the position at the second time and the reference position at the first time, and determine a compensated position of the distal end of the instrument based on the EM location data and the current offset.


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