The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2022
Filed:
Nov. 25, 2019
Applicant:
Accuray, Inc., Sunnyvale, CA (US);
Inventors:
Chuanyong Bai, Solon, OH (US);
Amit Jain, Solon, OH (US);
Daniel Gagnon, Twinsburg, OH (US);
Zhicong Yu, Highland Hts., OH (US);
Jacob Shea, Madison, WI (US);
Assignee:
Accuray Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 11/00 (2006.01); A61B 6/03 (2006.01); A61B 6/06 (2006.01); A61B 6/02 (2006.01); A61N 5/10 (2006.01); A61B 6/08 (2006.01); G06T 7/30 (2017.01); A61B 5/055 (2006.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5282 (2013.01); A61B 6/027 (2013.01); A61B 6/032 (2013.01); A61B 6/06 (2013.01); A61B 6/405 (2013.01); A61B 6/4078 (2013.01); A61B 6/4085 (2013.01); A61B 6/469 (2013.01); A61B 6/488 (2013.01); A61B 6/5205 (2013.01); G06T 11/005 (2013.01); A61B 5/055 (2013.01); A61B 6/025 (2013.01); A61B 6/03 (2013.01); A61B 6/035 (2013.01); A61B 6/0407 (2013.01); A61B 6/08 (2013.01); A61B 6/4014 (2013.01); A61B 6/4021 (2013.01); A61B 6/4028 (2013.01); A61B 6/4064 (2013.01); A61B 6/4435 (2013.01); A61B 6/4441 (2013.01); A61B 6/4458 (2013.01); A61B 6/481 (2013.01); A61B 6/482 (2013.01); A61B 6/483 (2013.01); A61B 6/484 (2013.01); A61B 6/541 (2013.01); A61B 6/582 (2013.01); A61N 5/107 (2013.01); A61N 5/1049 (2013.01); A61N 5/1067 (2013.01); A61N 5/1071 (2013.01); A61N 5/1082 (2013.01); A61N 2005/1085 (2013.01); A61N 2005/1091 (2013.01); A61N 2005/1095 (2013.01); G06T 7/30 (2017.01); G06T 11/008 (2013.01); G06T 2207/10081 (2013.01); G06T 2210/41 (2013.01); G06T 2211/404 (2013.01); G06T 2211/412 (2013.01); G06T 2211/424 (2013.01); G06T 2211/428 (2013.01); G06T 2211/432 (2013.01);
Abstract
An x-ray imaging apparatus and associated methods are provided to receive measured projection data in a primary region and measured scatter data in asymmetrical shadow regions and determine an estimated scatter in the primary region based on the measured scatter data in the shadow region(s). The asymmetric shadow regions can be controlled by adjusting the position of the beam aperture center on the readout area of the detector. Penumbra data may also be used to estimate scatter in the primary region.