The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Jul. 19, 2019
Applicant:

Dalian University of Technology, Dalian, CN;

Inventors:

Kai Zhao, Dalian, CN;

Yongxin Liu, Dalian, CN;

Younian Wang, Dalian, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05H 1/00 (2006.01); H01F 27/29 (2006.01); H01B 11/18 (2006.01); H01F 27/36 (2006.01); G01R 33/02 (2006.01); G01R 13/00 (2006.01);
U.S. Cl.
CPC ...
H05H 1/0087 (2013.01); G01R 13/00 (2013.01); G01R 33/02 (2013.01); H01B 11/1895 (2013.01); H01F 27/29 (2013.01); H01F 27/36 (2013.01);
Abstract

The present invention discloses a magnetic probe device. The magnetic probe device includes a magnetic probe body and a signal processing circuit, and an output end of the magnetic probe body is connected with an input end of the signal processing circuit; the signal processing circuit includes a first capacitor, a second capacitor, a Faraday shield and a step-up transformer, and the Faraday shield is fixedly arranged between a primary winding and a secondary winding of the step-up transformer; a center tap is arranged at the primary winding of the step-up transformer, and the center tap is grounded; and a first end of the primary winding is in series connection with the first capacitor, and a second end of the primary winding is in series connection with the second capacitor. The magnetic probe device provided by the present invention can improve the signal-to-noise ratio of a magnetic probe and the measurement accuracy of the magnetic field in plasma.


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