The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Apr. 30, 2019
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Arunava Das Gupta, Bangalore, IN;

Niladri Bhattacharya, Bangalore, IN;

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/08 (2006.01); H04L 12/24 (2006.01); H04L 67/1097 (2022.01); H04L 67/5682 (2022.01); H04L 41/16 (2022.01);
U.S. Cl.
CPC ...
H04L 67/1097 (2013.01); H04L 41/16 (2013.01); H04L 67/2852 (2013.01);
Abstract

Systems and methods for tiering data in distributed data networks. A global model is developed based on federated learning where edge servers are able to train a model. The learning from the edge servers are collectively applied to the global model. This process can be repeated until the global model is ready for deployment. The global model allows data to be tiered. This may include pushing data from a datacenter to edge servers or cleaning edge servers of data that does not satisfy the global model. The model can be retrained and can be used to proactively push new content out to the edge servers.


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