The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
Mar. 06, 2020
Applicants:
Peyman Neshaastegaran, Ottawa, CA;
Ming Jian, Kanata, CA;
Inventors:
Peyman Neshaastegaran, Ottawa, CA;
Ming Jian, Kanata, CA;
Assignee:
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/34 (2006.01); H04L 27/36 (2006.01); H03B 5/04 (2006.01); H04N 21/2383 (2011.01); H04B 3/462 (2015.01); H03B 5/20 (2006.01);
U.S. Cl.
CPC ...
H04L 27/362 (2013.01); H03B 5/04 (2013.01); H03B 5/20 (2013.01); H04B 3/462 (2013.01); H04N 21/2383 (2013.01);
Abstract
Some aspects of the present disclosure relate to detection of a Phase Hit and, upon detecting the Phase Hit, determining the magnitude and location of the Phase Hit. Detecting the Phase Hit may involve comparing a phase offset difference for successive pilot symbol to a detection threshold. Determination of the detection threshold may involve a Neyman-Pearson binary hypothesis testing (NP-BHT) approach. Once the magnitude and location of the Phase Hit are known, data symbols received after the location may be processed to remove the magnitude of the Phase Hit.