The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
Oct. 14, 2021
Sas Institute Inc., Cary, NC (US);
Thomas Dale Anderson, Peoria, AZ (US);
Priyadarshini Sharma, Bellevue, WA (US);
Mark Joseph Konya, Innsbrook, MO (US);
James M. Caton, Ave Maria, FL (US);
SAS INSTITUTE INC., Cary, NC (US);
Abstract
Operational events associated with a target physical device can be detected for mitigation by implementing some aspects described herein. For example, a system can apply a sliding window to received sensor measurements at successive time intervals to generate a set of data windows. The system can determine a set of eigenvectors associated with the set of data windows by performing principal component analysis on a set of data points in the set of data windows. The system can determine a set of angle changes between pairs of eigenvectors. The system can generate a measurement profile by executing an integral transform on the set of angle changes. One or more trained machine-learning models are configured to detect an operational event associated with the target physical device based on the measurement profile and generate an output indicating the operational event.