The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
Mar. 31, 2020
Applicant:
Sumitomo Chemical Company, Limited, Tokyo, JP;
Inventors:
Assignee:
SUMITOMO CHEMICAL COMPANY, LIMITED, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
H01M 50/403 (2021.01); G01N 23/04 (2018.01); B65H 26/00 (2006.01); B65H 21/00 (2006.01); H01M 10/0525 (2010.01); B65H 18/28 (2006.01);
U.S. Cl.
CPC ...
H01M 50/403 (2021.01); B65H 21/00 (2013.01); B65H 26/00 (2013.01); G01N 23/04 (2013.01); B65H 18/28 (2013.01); B65H 2301/542 (2013.01); B65H 2515/84 (2013.01); B65H 2553/40 (2013.01); G01N 2223/3306 (2013.01); G01N 2223/646 (2013.01); H01M 10/0525 (2013.01);
Abstract
To carry out accurate defect inspection over a wide area, a defect inspection device includes: a radiation source section configured to emit an electromagnetic wave to a separator roll; and a sensor section configured to detect the electromagnetic wave that the radiation source section has emitted to the separator roll, the sensor section being configured to detect the electromagnetic wave before and after the separator roll is moved relative to the radiation source section.