The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
Nov. 09, 2017
Applicant:
Becton, Dickinson and Company, Franklin Lakes, NJ (US);
Inventors:
Strett Roger Nicolson, Owings Mills, MD (US);
Rajeev Sehgal, Cockeysville, MD (US);
Assignee:
BECTON, DICKINSON AND COMPANY, Franklin Lakes, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); H04N 7/15 (2006.01); G16H 80/00 (2018.01); G16H 40/67 (2018.01); G16H 10/40 (2018.01); G16H 30/20 (2018.01); G16H 30/40 (2018.01); G06F 3/04847 (2022.01); G10L 25/51 (2013.01); H04L 67/104 (2022.01);
U.S. Cl.
CPC ...
G16H 80/00 (2018.01); G06F 3/04847 (2013.01); G10L 25/51 (2013.01); G16H 10/40 (2018.01); G16H 30/20 (2018.01); G16H 30/40 (2018.01); G16H 40/67 (2018.01); H04L 67/104 (2013.01);
Abstract
Systems and methods are provided for selecting colony locations. Selecting colony locations can include determine a location of a selection tool on a culture plate image, determining a location of a potential source of error on the culture plate image, comparing the location of the selection tool to the location of the potential source of error; and determining an error when the location of the selection tool overlays the location of the potential source of error.