The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Feb. 06, 2019
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Shinya Matsumoto, Osaka, JP;

Yasuhiro Ohnishi, Kyotanabe, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 7/521 (2017.01); G06T 7/62 (2017.01); G06T 7/73 (2017.01); G01B 11/25 (2006.01); G06V 10/40 (2022.01); G06V 10/145 (2022.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/254 (2013.01); G06T 7/62 (2017.01); G06T 7/73 (2017.01); G06V 10/145 (2022.01); G06V 10/40 (2022.01);
Abstract

The three-dimensional measurement apparatus includes a light projecting unit projects, onto a target, a pattern in which data is encoded, an image capturing unit captures an image of the target onto which the pattern is projected, and a calculation unit calculates positions of a three-dimensional point group based on positions of the feature points and the decoded data, in which the pattern includes unit patterns that each expresses at least two bits and are used in order to calculate the positions of the three-dimensional point group, the unit patterns each includes a first region and a second region that has an area that is larger than an area of the first region, and an area ratio between the first region and the second region is at least 0.3 and not more than 0.9.


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