The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Mar. 24, 2020
Applicant:

Canon Virginia, Inc., Newport News, VA (US);

Inventors:

Xiwu Cao, Arcadia, CA (US);

Bradley Scott Denney, Irvine, CA (US);

Assignee:

Canon Virginia, Inc., Newport News, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/12 (2017.01); G06T 7/50 (2017.01); G06T 7/136 (2017.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/12 (2017.01); G06T 7/0004 (2013.01); G06T 7/136 (2017.01); G06T 7/50 (2017.01);
Abstract

Some embodiments of devices, systems, and methods obtain at least one first image, wherein the at least one first image is defined in an image space; select at least one feature in the at least one first image; define a topology based on the at least one feature; generate a topology mapping between the topology and the image-space topology; obtain a plurality of anomaly scores, wherein each anomaly score of the plurality of anomaly scores was generated based on a respective detection area in a second image; map the plurality of anomaly scores to the topology based on the topology mapping; and normalize each anomaly score in the plurality of anomaly scores based on the respective neighboring anomaly scores in the topology, thereby generating normalized anomaly scores.


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