The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Nov. 05, 2018
Applicant:

Osaka University, Osaka, JP;

Inventors:

Kazuaki Nakane, Osaka, JP;

Hirofumi Yamamoto, Osaka, JP;

Mizuho Nishio, Kyoto, JP;

Assignee:

OSAKA UNIVERSITY, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/187 (2017.01); G06T 7/136 (2017.01); G06T 7/11 (2017.01); A61B 5/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); G06T 7/187 (2017.01); A61B 5/7264 (2013.01); A61B 5/7275 (2013.01); A61B 6/032 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30061 (2013.01); G06T 2207/30096 (2013.01);
Abstract

In order to assess, with high accuracy, a degree of a change having occurred in a structure, the present invention includes: a Betti number calculating section () configured to (I) generate, with respect to a single captured image obtained by capturing an image of a structure, a plurality of binarized images having respective binarization reference values different from each other and (II) calculate, for each of the plurality of binarized images, a first characteristic numerical value indicative of the number of connected regions each of which is obtained by connecting pixels each having one of pixel values obtained by binarization; and a prediction score determining section () configured to determine, in accordance with a result of a comparison, information on a change having occurred in the structure, the comparison having been made between (i) a pattern indicative of a relationship between (a) the respective binarization reference values and (b) the first characteristic numerical value and (ii) a predetermined reference pattern.


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