The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
Jul. 30, 2020
International Business Machines Corporation, Armonk, NY (US);
Chao Xin, Ningbo, CN;
Zhuo Cai, Beijing, CN;
Hong Bing Zhang, Beijing, CN;
Dan Zhang, Beijing, CN;
Guang Qing Zhong, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, computer system, and a computer program product for analyzing visual defects is provided. The present invention may include generating a template image. The present invention may include capturing a test image. The present invention may include performing an image registration between the template image and the test image. The present invention may include generating a registered test image. The present invention may include performing an image difference analysis between the registered test image and the template image. The present invention may include generating a differential image. The present invention may include synthesizing the registered, differential image, and template image. The present invention may include generating a synthetic image. The present invention may include inputting the synthetic image into a multi-scale detection network. The present invention may include generating a defect map.