The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
May. 05, 2020
Sas Institute Inc., Cary, NC (US);
Kyungduck Cha, Cary, NC (US);
Carol Wagih Sadek, Durham, NC (US);
Zohreh Asgharzadeh Talebi, Raleigh, NC (US);
SAS INSTITUTE INC., Cary, NC (US);
Abstract
Physical-device anomalies and degradation can be mitigated by implementing some aspects described herein. For example, a system can determine a first data window and a second data window by applying a window function to streaming data. The system can determine a first principal eigenvector of the first data window and a first principal eigenvector of the second data window. The system can determine an angle change between the first principal eigenvectors of the two data windows. The system can then detect an anomaly based on determining that the angle change exceeds a predefined angle-change threshold. Additionally or alternatively, the system may compare the first principal eigenvector for the second data window to a baseline value to determine an absolute angle associated with the second data window. The system can then detect a degradation based on determining that the absolute angle exceeds a predefined absolute-angle threshold.