The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
Dec. 19, 2018
Novarum Dx Ltd;
Antonio Manuel Domingos Lopes, Scotland, GB;
Anthony Peter Ashbrook, Scotland, GB;
Neil Polwart, Scotland, GB;
Novarum DX Ltd., Edinburgh Central, GB;
Abstract
An acquired image is analysed to determine a test outcome value. A shape template for a test structure is provided to identify a position of a target measurement region on the test structure. A mapping defining a transformation of the shape template onto the image frame is determined. A mapping is determined and it is determined if a first matching condition based on first displacements of one or more edges identified in the image frame relative to the shape template is satisfied for the mapping. When the mapping satisfies the first matching condition and a second different matching condition based on second displacements of one or more edges identified in the image frame relative to the shape template, a verified image of a test structure is established. In the verified image of the test structure a target measurement region is identified. A test outcome value is determined by analysing the target measurement region.