The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Mar. 23, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Rob Bean, Mahopac, NY (US);

Alexis Nicole Hatzis Liakas, New York, NY (US);

Anthony Mauricio Pallone, Hopewell Junction, NY (US);

Reza Sarbakhsh, New York, NY (US);

Kriteshwar Kaur Kohli, White Plains, NY (US);

Charles Christopher Walker, Cary, NC (US);

Raj Nagesh, Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G06F 40/279 (2020.01); G06F 40/30 (2020.01); G06F 3/04842 (2022.01); G06K 9/62 (2022.01); G06V 10/75 (2022.01); G06V 30/418 (2022.01);
U.S. Cl.
CPC ...
G06F 40/279 (2020.01); G06F 3/04842 (2013.01); G06F 40/30 (2020.01); G06K 9/6215 (2013.01); G06V 10/757 (2022.01); G06V 30/418 (2022.01);
Abstract

A system identifies a first text fragment as being under evaluation, wherein the first text is in at least a first document being compared to a second document using a first semantic model. The system compares the first text fragment to one or more text fragments of the second document. The system identifies top-k text fragments in the second document that are most similar to the first text fragment based on processing using the first semantic model. The system presents a user, via a graphical user interface (GUI), the top-k text fragments in visual proximity to the first text fragment.


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