The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Sep. 17, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Kenichiro Kurihara, Yamanashi, JP;

Shinji Akimoto, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/10 (2006.01); G01R 31/3181 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1004 (2013.01); G06F 11/1048 (2013.01); G01R 31/31816 (2013.01);
Abstract

The memory error determination device includes a processor configured to: detect a memory element in which an error has occurred in each of a plurality of layers included in a memory being three-dimensionally stacked, specify a position of each memory element in which the error has occurred in each of the plurality of layers, and determine that, when the position of each memory element in which the error has occurred is linearly aligned across a predetermined number of layers among the plurality of layers, the predetermined number being two or more, an error that has occurred in the memory is a soft error due to radiation incident on the memory.


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