The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
Jun. 29, 2020
International Business Machines Corporation, Armonk, NY (US);
Chris Moss, Brisbane, AU;
Simon J. Kofkin-Hansen, San Francisco, CA (US);
Jordan Shamir, Austin, TX (US);
Devin Conley, Austin, TX (US);
James Patrick Hoff, Chapel Hill, NC (US);
Iain Mccown, Austin, TX (US);
Scott Moonen, Fuquay Varina, NC (US);
Bryan M. Buckland, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method comprises obtaining a set of log files for a software system. The set of log files applies to an extended window. A periodic pattern in a first set of error-event surges in the set of log files is identified. The error-event surges in the first set is identified as event noise. A second set of log files for the software system is obtained. The second set of log files applies to a shortened window. Timeseries analysis on the second set of log files is performed. A particular error-event surge in a detection period in the second set of log files that is abnormal as compared to the shortened window is detected based on the timeseries analysis. That the particular error-event surge does not fit into the periodic pattern is determined, the particular error-event surge is characterized as an anomaly, based on the determining.