The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
Apr. 10, 2019
Honeywell International S.r.o, Praha 4—Chodov, CZ;
Zdenek Kana, Dubnany, CZ;
Mats Anders Brenner, Plymouth, MN (US);
Pavol Malinak, Markusovce, SK;
James Arthur McDonald, Minneapolis, MN (US);
Honeywell International Inc., Charlotte, NC (US);
Abstract
Systems and methods for integrity monitoring of primary and derived parameters are described herein. In certain embodiments, a method includes transforming an estimated error state covariance matrix of at least one primary integrity monitoring parameter of a navigation system onto an error state covariance matrix of one or more derived integrity monitoring parameters, wherein the one or more derived integrity monitoring parameters depends from the at least one primary integrity monitoring parameter. The method also includes transforming an integrity threshold of the at least one primary integrity monitoring parameter onto separation parameters of the one or more derived integrity monitoring parameters. The method further includes computing a protection limit for the one or more derived integrity monitoring parameters.