The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Jan. 18, 2019
Applicant:

Gtheranostics Co., Ltd., Tokyo, JP;

Inventor:

Hidemi Shigekawa, Tsukuba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/10 (2010.01); G01N 21/63 (2006.01); G01Q 70/08 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/10 (2013.01); G01N 21/636 (2013.01); G01Q 70/08 (2013.01);
Abstract

A scanning probe microscope includes: a pump light output unit that emits pump light having a first specified phase to a specimen and performs emission of the pump light a plurality of number of times to excite the specimen; a probe light output unit that emits probe light having a second specified phase to the specimen once while the specimen is excited by one-time emission of the pump light; and a scanning probe that detects, from the specimen, a probe signal corresponding to each one-time emission of the probe light, wherein the pump light output unit or the probe light output unit includes a delay time adjustment unit that adjusts delay time from a start of the emission of the pump light until a start of the emission of the probe light.


Find Patent Forward Citations

Shigekawa, Hidemi. (2022). Scanning probe microscope (U.S. Patent No. 11320456). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11320456

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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