The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Feb. 15, 2018
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Hiroya Umeki, Tokyo, JP;

Kenta Imai, Tokyo, JP;

Yoshihiro Yamashita, Tokyo, JP;

Shunsuke Sasaki, Tokyo, JP;

Akihiro Endou, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00712 (2013.01); G01N 35/1002 (2013.01); G01N 2035/106 (2013.01);
Abstract

An automatic analysis device includes a probe that performs a dispensing operation including a suction process and a discharge process with respect to liquid; a syringe that generates a pressure change for dispensing liquid at the probe; a flow path that connects the probe and the syringe with each other; a pressure sensor that measures the pressure change in the flow path at the time of liquid dispensing; a storage portion that stores a pressure change of time-series when reference fluid is discharged as a reference discharge pressure waveform; and a determination portion that determines whether or not there is an abnormality in the suction process of the sample from a relationship between a value of difference or a ratio between the reference discharge pressure waveform and the pressure waveform of a determination target at the time of discharge of liquid and normal range.


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