The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Jun. 16, 2016
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventor:

Akira Maekawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/72 (2006.01); G01N 27/62 (2021.01); G01N 30/02 (2006.01); G01N 30/24 (2006.01); G01N 30/86 (2006.01); G01N 30/46 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8651 (2013.01); G01N 30/466 (2013.01); G01N 30/7233 (2013.01);
Abstract

In the present invention, an analysis schedule is pre-created such that streams of a plurality of liquid chromatograms can operate in parallel and a mass spectrometer can collect data at the timing of each component elution. A control unit controls so as to: divide the time required to analyze each sample in a plurality of liquid chromatogram systems into pre-collection time, time during collection, and post-collection time; search and allocate time positions in which the time during collection in the liquid chromatogram units do not overlap; determine start times for the plurality of liquid chromatogram units to thereby create an analysis schedule; and thereafter perform analysis. The control unit further stores parameter sets for varying component elution times, adjusts analysis parameters so as to make data collection timings appropriate for creating an analysis schedule, and changes the component elution times.


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