The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Aug. 13, 2021
Applicant:

China University of Geosciences (Wuhan), Wuhan, CN;

Inventors:

Huiming Tang, Wuhan, CN;

Junrong Zhang, Wuhan, CN;

Changdong Li, Wuhan, CN;

Wenping Gong, Wuhan, CN;

Yongquan Zhang, Wuhan, CN;

Zongxing Zou, Wuhan, CN;

Chengyuan Lin, Wuhan, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
E21D 11/00 (2006.01); E21D 11/10 (2006.01); E21F 15/10 (2006.01);
U.S. Cl.
CPC ...
E21D 11/105 (2013.01); E21F 15/10 (2013.01);
Abstract

An arrangement method for deformation of a locked patch crack of a rock slope, includes: connecting a filling pipeline on a bladder-type monitoring probe to a mortar guiding pipe through an automatic locking and unlocking device, clamping a portion to be clamped on a bladder by a clamping assembly, driving a clamping driving mechanism to move towards an adit by a push driving mechanism, and pushing the bladder into the adit; injecting cement mortar into the bladder through the mortar guiding pipe by utilizing a high-pressure injection machine to expand the bladder until an upper surface and a lower surface of the bladder abut against an upper surface and a lower surface of the adit, and making a monitor on the bladder abut against the upper and lower surfaces of the adit; and arranging a plurality of bladder-type monitoring probes in an array in the adit.


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