The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
Mar. 03, 2017
Sms Group Gmbh, Duesseldorf, DE;
Mostafa Biglari, Stuttgart, DE;
Holger Behrens, Erkrath, DE;
Carsten Andreas Klein, Düsseldorf, DE;
Christian Klinkenberg, Herdecke, DE;
Lutz Kuemmel, Jüchen, DE;
Ulrich Sommers, Düsseldorf, DE;
SMS GROUP GMBH, Duesseldorf, DE;
Abstract
The invention relates to a method for rolling a metal product (), wherein the metal product is subjected to a rolling operation at a first station (), which rolling operation is controlled by a control device (), wherein the product () is subject to a measurement at a second station (), wherein the product () is subjected to a further processing operation at a third station (), and wherein the product () is in a specified quality at a fourth station (). In order to increase the quality of the produced strip, the invention provides that the method has the following steps: a) measuring the value of a material property (IW) that the second station (); b) feeding the value measured at the second station () to the control device (), comparing the measured value with a value (SW) stored in the control device (), and adjusting a parameter (PPI) if the measured value deviates from the stored value (SW), e) measuring a value of a quality material property (Q) at the fourth station (); d) comparing the measured value with a stored value, and initiating a measure to influence the quality material property (Q) if the measured value deviates from the stored value beyond a permissible tolerance.