The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Sep. 19, 2019
Applicants:

Albert-ludwigs-universitaet Freiburg, Freiburg, DE;

Deutsches Krebsforschungszentrum Stiftung Des Oeffentlichen Rechts, Heidelberg, DE;

Inventors:

Toni Cathomen, Freiburg, DE;

Giandomenico Turchiano, Freiburg, DE;

Georges Blattner, Freiburg, DE;

Gianni Monaco, Ariano Irpino, IT;

Melanie Boerries, Heidelberg, DE;

Geoffroy Andrieux, Heidelberg, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6848 (2018.01); C12Q 1/6869 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6848 (2013.01); C12Q 1/6869 (2013.01);
Abstract

Disclosed is a method for high-throughput detection of genome-wide modifications in a nucleic acid genome obtained from a cell or tissue caused by the activity of a designer nuclease comprising the following steps:


Find Patent Forward Citations

Cathomen, Toni. (2022). Method for characterization of modifications caused by the use of designer nucleases (U.S. Patent No. 11319580). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11319580

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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