The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
Aug. 15, 2019
Applicant:
Fanuc Corporation, Yamanashi, JP;
Inventor:
Takashi Izumi, Yamanashi, JP;
Assignee:
FANUC CORPORATION, Yamanashi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 31/00 (2006.01); B23K 26/14 (2014.01); B23K 26/70 (2014.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
B23K 31/006 (2013.01); B23K 26/1462 (2015.10); B23K 26/705 (2015.10); G06N 3/08 (2013.01);
Abstract
A machining condition adjustment device adjusts settings of an ionizer so as to neutralize a charge carried by plasma generated during laser beam machining of a workpiece by a laser beam machining device, calculates an amount of charge per unit time that is to be radiated from the ionizer, based on the amount of charge carried by the plasma generated during the laser beam machining, and sets the ionizer to radiate the calculated amount of charge per unit time.
Izumi, Takashi. (2022). Machining condition adjustment device and machine learning device (U.S. Patent No. 11318565). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11318565
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile