The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Aug. 21, 2018
Applicant:

Komatsu Industries Corporation, Kanazawa, JP;

Inventors:

Satoshi Kitayama, Kanazawa, JP;

Takuya Noda, Kanazawa, JP;

Takuji Miyasaka, Kanazawa, JP;

Takahiro Noguchi, Tokyo, JP;

Kiichiro Kawamoto, Kanazawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B21D 24/14 (2006.01); B21D 24/02 (2006.01); G05B 19/406 (2006.01); G06F 30/00 (2020.01); G05B 19/18 (2006.01); G05B 13/04 (2006.01);
U.S. Cl.
CPC ...
B21D 24/14 (2013.01); B21D 24/02 (2013.01); G05B 13/042 (2013.01); G05B 19/18 (2013.01); G05B 19/406 (2013.01); G06F 30/00 (2020.01); G05B 2219/2622 (2013.01);
Abstract

A press system includes a press portion and a controller configured to control the press portion. The controller includes a load pattern generator, an evaluation input unit, and an optimum load pattern setting unit configured to set an optimum load pattern based on a plurality of evaluations of the quality input by the evaluation input unit. The optimum load pattern setting unit includes a response surface generator configured to create from evaluation value data based on the plurality of load patterns and the plurality of evaluations of the quality, by using as an objective function, the evaluation value data with the load pattern being defined as a design variable, a response surface of the objective function, and an optimization calculator configured to find an optimum solution of the objective function of the response surface by optimization.


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