The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2022

Filed:

Dec. 20, 2019
Applicant:

GE Precision Healthcare Llc, Milwaukee, WI (US);

Inventors:

Laurence Vancamberg, Poissy, FR;

Serge Muller, Guyancourt, FR;

Assignee:

GE Precision Healthcare LLC, Milwaukee, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/02 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 6/5211 (2013.01); A61B 6/025 (2013.01); A61B 6/502 (2013.01); A61B 6/584 (2013.01); G06T 7/0012 (2013.01); G06T 2200/24 (2013.01); G06T 2207/30068 (2013.01);
Abstract

Various methods and systems are provided for workflow monitoring during x-ray mammography and related procedures. In one example, a vision system is utilized to monitor an x-ray mammography system, accessories associated with the system, and surrounding environment. Based on the detection and user indications, via a user interface for example, one or more of a current mode of operation of the x-ray system, a current workflow step in the current mode, and one or more errors may be identified using the vision system, and one or more of indications to the user and system adjustments may be performed based on the identification.


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