The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
Jun. 28, 2019
Korea Institute of Science and Technology, Seoul, KR;
Inchan Youn, Seoul, KR;
Kuiwon Choi, Seoul, KR;
Hyung Min Kim, Seoul, KR;
Suh-Yeon Dong, Seoul, KR;
Hyunmyung Cho, Seoul, KR;
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY, Seoul, KR;
Abstract
The present invention relates to a stress analysis method including: acquiring bio-signals from a test subject; calculating a probability of each of a plurality of stress level values by processing the bio-signals using a deep neural network algorithm; estimating a stress level value with the maximum probability of the plurality of stress level values as a stress level value of the test subject; determining usefulness of the estimated stress level value; and outputting the estimated stress level value determined to be useful through the determination of usefulness, as the final stress level.