The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 03, 2022
Filed:
May. 02, 2017
Carl Zeiss Meditec Ag, Jena, DE;
Adolf Friedrich Fercher, Weissensee, AT;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
Measurement of intraocular lengths by dual-beam Fourier low-coherence interferometry on the basis of Fresnel-zone-type space-time domain interferograms of the Purkinje-Sanson reflexes. The eye is illuminated by parallel, monochromatic dual beams having wavelengths which differ in temporal sequence. Wavelength spectra of space-time domain interferograms are imaged onto a photodetector array and registered. Viewing direction and position of the eye are fixed by optical aids and are monitored by acoustic and optical aids. A zoom optical unit in the output beam of the ophthalmological interferometer makes it possible, by simple focusing, to image virtual Fresnel-zone-type space-time domain interferograms from contrast-optimized positions onto the photodetector array or onto an image intensifier that is arranged in front of the photodetector array such that the position-dependent size change of the space-time domain interferograms is compensated by the scale change of this imaging.