The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Aug. 07, 2020
Applicant:

Huawei Technologies Co., Ltd., Guangdong, CN;

Inventors:

Changfeng Ding, Chengdu, CN;

Xiao Han, Shenzhen, CN;

Rong He, Chengdu, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 72/04 (2009.01); H04W 72/08 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04W 72/046 (2013.01); H04W 72/0426 (2013.01); H04W 72/085 (2013.01);
Abstract

Embodiments of the present application provide a spatial reuse method. The method includes: receiving, by a first node in BSSa measurement request sent by a second node in BSSwhere one or more first service periods SPare allocated in the BSSone or more second service periods SPare allocated in the BSSand the measurement request is used to request to measure the one or more second service periods SPreceiving, by the first node in the BSSa measurement report of the second node in the BSSwhere the measurement report is a report of measuring the one or more first service periods SPand determining, by the first node in the BSSbased on the received measurement report, whether to allow spatial reuse of the one or more first service periods SPand the one or more second service periods SP


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