The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Mar. 09, 2021
Applicant:

Renesas Electronics America Inc., Milpitas, CA (US);

Inventors:

Chun Cheung, Bridgewater, NJ (US);

Keerthi Varman Anna Jayaprakash, Edison, NJ (US);

Fumihito Hayashi, Takasaki, JP;

Yuji Ikeda, Atsugi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/153 (2006.01); H03K 3/037 (2006.01); G01R 31/54 (2020.01); G01R 19/165 (2006.01); H03K 5/24 (2006.01);
U.S. Cl.
CPC ...
H03K 3/0372 (2013.01); G01R 19/16576 (2013.01); G01R 31/54 (2020.01); H03K 5/24 (2013.01);
Abstract

Systems and methods for detecting an open condition in a master-slave configuration are described. In an example, a controller can be integrated in a slave device of a master-slave configuration. The controller can be configured to activate a current source to supply a current to a pin of the slave device. The controller can be further configured to compare a voltage measured at the pin of the slave device with a reference voltage. The controller can be further configured to, based on the comparison, determine a presence or an absence of an open condition associated with the pin of the slave device. The controller can be further configured to output a signal representing the determination of the presence or the absence of the open condition to a master device.


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