The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Jun. 03, 2020
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Kranthi Kumar Vaidyula, Karnataka, IN;

Amiya Banerjee, Karnataka, IN;

Phani Raghavendra Yasasvi Gangavarapu, Karnataka, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/16 (2006.01); G11C 16/30 (2006.01); G11C 16/12 (2006.01); G11C 16/34 (2006.01); G11C 16/04 (2006.01); G11C 16/14 (2006.01);
U.S. Cl.
CPC ...
G11C 16/16 (2013.01); G11C 16/0483 (2013.01); G11C 16/12 (2013.01); G11C 16/14 (2013.01); G11C 16/30 (2013.01); G11C 16/349 (2013.01); G11C 16/3436 (2013.01); G11C 16/3445 (2013.01); G11C 16/3472 (2013.01); G11C 2216/18 (2013.01);
Abstract

Aspects of a storage device including a memory and controller are provided which allow for erase voltages applied during erase operations to be adaptively changed at elevated temperatures to reduce erase time and prevent erase failures. In response to detecting a lower temperature of the memory, the controller applies a first erase voltage to cells in a block of a die, and in response to detecting a higher temperature of the memory, the controller applies a second erase voltage larger than the first erase voltage to the cells in the block of the die. The controller may apply the different erase voltages depending on whether the temperature of the die falls within respective temperature ranges or meets a respective temperature threshold, which may change for different dies. As a result, successful erase operations at higher temperatures may be achieved.


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