The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Dec. 26, 2020
Applicant:

Idemia Identity & Security Usa Llc, Billerica, MA (US);

Inventors:

Peter Zhen-Ping Lo, Mission Viejo, CA (US);

Hui Zhu, Anaheim, CA (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/12 (2022.01); G06V 40/40 (2022.01); G06V 40/13 (2022.01);
U.S. Cl.
CPC ...
G06V 40/1376 (2022.01); G06V 40/13 (2022.01); G06V 40/1359 (2022.01);
Abstract

A method for detection of altered fingerprints includes receiving, by at least one processor, an image of a fingerprint from a fingerprint reader. The image has an image resolution. The processor determines a spatial location of the fingerprint within the image. The processor crops the image around the spatial location to provide a cropped image. The processor generates multiple derived images using the cropped image, such that each derived image has the image resolution. The processor generates a multiple-channel image using the derived images. The processor scales the multiple-channel image to an image size. The processor generates a score using a machine learning model. The score is based on the multiple-channel image and is indicative of a likelihood that the fingerprint has been altered.


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