The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Apr. 20, 2020
Optrascan, Inc, Cupertino, CA (US);
Abhijeet Sharadchandra Gholap, Cupertino, CA (US);
Isha Doshi, Cupertino, CA (US);
Gurunath Kamble, Cupertino, CA (US);
OPTRASCAN, INC, Cupertino, CA (US);
Abstract
In a method of operation of an artificial intelligence-equipped specimen scanning and analysis unit to digitally scan and analyze pathological specimen slides, a sample slide with a mounted tissue sample is scanned and analyzed according to one or more user-selected algorithms in order to generate a heatmap visually depicting the presence of one or more user-selected sample attributes of the tissue sample. One or more artificial intelligence modules, including a deep learning computation module, is provided and can be trained by the user for future analysis of new samples. One or more regions of interest may be selected from the heatmap to include in the results of the analysis. A focus window may be used to closely inspect any given region of the whole slide image, and a trail map is generated from the movement of the focus window.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile