The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Dec. 12, 2018
Applicant:
Industrial Technology Research Institute, Hsinchu, TW;
Inventors:
Yu-Ting Lai, Taitung, TW;
Jwu-Sheng Hu, Zhubei, TW;
Ya-Hui Tsai, Taoyuan, TW;
Keng-Hao Chang, Taichung, TW;
Assignee:
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06K 9/627 (2013.01); G06K 9/6215 (2013.01); G06K 9/6259 (2013.01); G06T 2207/20081 (2013.01);
Abstract
An industrial image inspection method includes: generating a test latent vector of a test image; measuring a distance between a training latent vector of a normal image and the test latent vector of the test image; and judging whether the test image is normal or defected according to the distance between the training latent vector of the normal image and the test latent vector of the test image.