The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Oct. 04, 2018
Applicant:

Viant Technology Llc, Irvine, CA (US);

Inventors:

Adrian Witas, Los Angeles, CA (US);

Varoujan Bedirian, Los Angeles, CA (US);

Assignee:

VIANT TECHNOLOGY LLC, Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2458 (2019.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06F 16/2462 (2019.01);
Abstract

A method and system provide the ability to forecast events that match a criterion. Input is received and includes an event set and a criterion. The event set includes events and each of the events is a record with features. Each feature is an instance of a feature type (FT) and feature value (FV) combination. The criterion is a logical statement that specifies a criterion FT, a criterion FV, and an operator. The event set is partitioned and a partition BitSet is built for each partition. Each partition length of each partition BitSet is based on a number of the events. Based on the partition BitSets, a partition FT-FV count is created. For each partition, a partition FT criterion BitSet is created and a partition Criterion BitSet is computed based thereon. The forecast is then computed based on the partition Criterion BitSet.


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