The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Jan. 17, 2020
Applicant:

Turck Holding Gmbh, Halver, DE;

Inventors:

Rene Steiner, Hagen, DE;

Christoph Schmermund, Essen, DE;

Peter Strunkmann, Detmold, DE;

Assignee:

TURCK HOLDING GMBH, Halver, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/0875 (2016.01); G01D 21/02 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0875 (2013.01); G01D 21/02 (2013.01);
Abstract

Provided is a method for operating a measurement system including an evaluation module and several measuring elements. The evaluation module and the measuring elements are connected via a communication line. The method includes detecting measurement data via the several measuring elements. At least two of the measuring elements detect the measurement data at least partially at the same time. The method further includes: buffering the detected measurement data in the respective measuring element; and reading out the measurement data buffered in the measuring elements with the evaluation module via the communication line.


Find Patent Forward Citations

Steiner, Rene. (2022). Measurement system and method for operating a measurement system (U.S. Patent No. 11314651). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11314651

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…