The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Sep. 17, 2020
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Haiying Tang, Beijing, CN;
Zhilong Wu, Beijing, CN;
Jianbin Kang, Beijing, CN;
Rongrong Shang, Beijing, CN;
Jian Gao, Beijing, CN;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Techniques involve determining whether data read from a redundant array of independent disks (RAID) is corrupted, the RAID including two parity disks. The techniques further involve determining, based on the read data being corrupted, whether single-disk data recovery can recover the corrupted data. The techniques further involve recovering, based on the single-disk data recovery failing to recover the corrupted data, the corrupted data using dual-disk data recovery. Such techniques may present a recovery solution for silent data corruption of a RAID with two parity disks, such that corrupted data can be recovered in the case of either a single-disk failure or a dual-disk failure, thereby improving the storage system performance.