The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Apr. 30, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Rohit K. Chawla, Scotch Plains, NJ (US);

Dixitkumar Vishnubhai Patel, Monroe, NJ (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 12/1009 (2016.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/079 (2013.01); G06F 11/0727 (2013.01); G06F 11/0751 (2013.01); G06F 12/1009 (2013.01); G06F 2212/1044 (2013.01);
Abstract

An apparatus comprises a processing device configured to identify faults associated with a logical address space in a fault domain of a storage system, the faults specifying fault reason codes and metadata types for logical pages in the logical address space associated with the faults. The processing device is also configured to determine a fault summary characterizing impact of the faults in the fault domain of the storage system, the fault summary being based on aggregating fault scores assigned to the fault reason codes and the metadata types specified in the faults. The processing device is further configured to generate a recommendation on whether to initiate recovery of the fault domain of the storage system based on the fault summary, and to initiate recovery of the fault domain of the storage system based on the generated recommendation.


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