The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Jan. 08, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Mingu Kang, Old Tappan, NJ (US);

Seyoung Kim, White Plains, NY (US);

Kyu-hyoun Kim, Watervliet, NY (US);

Eun Kyung Lee, Bedford Corners, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/523 (2006.01); G06N 3/08 (2006.01); G06F 7/50 (2006.01);
U.S. Cl.
CPC ...
G06F 7/523 (2013.01); G06F 7/50 (2013.01); G06N 3/08 (2013.01);
Abstract

A system is provided for error resiliency in a bit serial computation. A delay monitor enforces an overall processing duration threshold for bit-serial processing all iterations for the bit serial computation, while determining a threshold for processing each iteration. At least some iterations correspond to a respective bit in an input bit sequence. A clock generator generates a clock signal for controlling a performance of the iterations. Each of iteration units perform a particular iteration, starting with a Most Significant Bit (MSB) of the input bit sequence and continuing in descending bit significant order, and by selectively increasing the threshold for at least one iteration while skipping from processing at least one subsequent iteration whose iteration-level processing duration exceeds a remaining amount of an overall processing duration for all iterations, responsive to the at least one iteration requiring more time to complete than a current value of the threshold.


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