The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Dec. 09, 2019
Applicant:

The Mathworks, Inc., Natick, MA (US);

Inventors:

Yit Phang Khoo, Natick, MA (US);

Jean-François Kempf, Westwood, MA (US);

Kalyan Bemalkhedkar, Needham, MA (US);

Mahesh Nanjundappa, Marlborough, MA (US);

Assignee:

The MathWorks, Inc., Natick, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G05B 19/4069 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4069 (2013.01); G06F 11/3684 (2013.01); G05B 2219/33286 (2013.01);
Abstract

Systems and methods evaluate assessments on time-series data. An expression including temporal operators may be created for an assessment. The expression may be arranged in the form of an expression tree having nodes representing input data to the assessment and intermediate results of the expression. An assessment may be evaluated by performing a bottom-up traversal of the expression tree. One or more plots may be generated including a plot of the outcome of the assessment, e.g., pass, fail, or untested, plots of intermediate results of the expression and plots of input data as a function of time. Graphical affordance may be presented on the plots that mark the regions that may have contributed to a specific pass or fail result of the assessment, and points within the regions that resulted in the assessment passing or failing.


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