The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Mar. 06, 2017
Apple Inc., Cupertino, CA (US);
Tobias Langner, Potsdam, DE;
Martin Haller, Berlin, DE;
Denis Williams, Krefeld, DE;
Arnd Rose, Stahnsdorf, DE;
APPLE INC., Cupertino, CA (US);
Abstract
The invention relates to a method for evaluating at least one view image (M) in order to image at least one viewpoint, which is provided in relation to at least one scene shot (S) of a scene (), and/or at least one view direction of at least one person (), said view direction being provided in relation to the at least one scene shot (S), towards a reference, the content of which matches at least one part of the scene (). The at least one scene shot (S) is provided with the at least one assigned viewpoint (B) and/or the at least one assigned view direction, and the reference (R) is provided together with a result (B') of the at least one view image (M). Furthermore, the at least one view image (M) is evaluated by means of at least one predefined quality measurement (GM), and the result of the evaluation is provided.