The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Jun. 25, 2018
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Werner Knebel, Kronau, DE;
Florian Fahrbach, Mannheim, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01); G02B 21/24 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 21/0076 (2013.01); G02B 21/24 (2013.01); G02B 21/367 (2013.01); G02B 21/0032 (2013.01);
Abstract
A microscope system includes a light sheet microscopy functional unit and at least one further light microscopy functional unit. The light sheet microscopy functional unit has an illumination objective which is formed by a first objective and a detection objective which is formed by a separate second objective. The at least one further light microscopy functional unit has a detection objective that is formed by the second objective.