The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Apr. 25, 2018
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Patric Mrawek, Hassloch, DE;

Thorsten Koester, Edingen-Neckarhausen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0076 (2013.01); G02B 21/008 (2013.01); G02B 21/0032 (2013.01);
Abstract

A microscope includes an illumination system configured to illuminate a sample chamber with laser pulses. The illumination system includes a control device with stored, modifiable illumination parameters, with trigger outputs, to which at least one externally triggerable laser system is connectable in each case, and with a trigger generator configured to produce temporally successive trigger signals for triggering the at least one laser system. The microscope is configured such that an assignment of the trigger signals to the trigger outputs and/or a time interval between successive ones of the trigger signals depends on the illumination parameters.


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