The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Feb. 18, 2020
Apple Inc., Cupertino, CA (US);
Gunes Dervisoglu, Santa Clara, CA (US);
Christopher D. Guichet, Mountain View, CA (US);
Adam S. Howell, Oakland, CA (US);
Alexander J. Wiens, San Jose, CA (US);
Christopher E. Balcells, Daly City, CA (US);
Erik L. Wang, Redwood City, CA (US);
Jonathan M. Beard, San Jose, CA (US);
Tang Y. Tan, Palo Alto, CA (US);
Theodore Lao, Plainfield, IL (US);
Tyler S. Bushnell, Mountain View, CA (US);
Hung A. Pham, Oakland, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A method for calibrating a magnetometer of an electronic device can include detecting a change in a magnetism of the electronic device, collecting a first magnetic field data from the magnetometer at sampling frequency of at least 1 hertz, generating an elliptical calibration model based at least partially on the collected first magnetic field data, collecting a second magnetic field data from the magnetometer, and fitting the collected second magnetic field data to a sphere using the elliptical calibration model.