The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
May. 17, 2019
Case Western Reserve University, Cleveland, OH (US);
Yuchi Liu, Cleveland, OH (US);
Jesse Hamilton, Cleveland Heights, OH (US);
Nicole Seiberlich, Shaker Heights, OH (US);
Mark A. Griswold, Shaker Heights, OH (US);
Case Western Reserve University, Cleveland, OH (US);
Abstract
A method for quantifying T1, T2 and resonance frequency simultaneously using magnetic resonance fingerprinting (MRF) includes accessing an MRF dictionary using a magnetic resonance imaging (MRI) system. The MRF dictionary is generated by simulating signal evolutions that include associated off-resonance effects for each signal evolution. The method further includes acquiring MRF data from a region of interest in a subject using the MRI system and a MRF pulse sequence having a plurality of radio frequency (RF) excitations and a readout associated with each RF excitation. Each readout includes a plurality of segments and each segment is used to generate a time frame. The method also include comparing the MRF data to the MRF dictionary to identify a plurality of parameters including T1, T2 and resonance frequency for the MRF data and generating a report indicating the at least one of the plurality of parameters of the MRF data.