The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 26, 2022

Filed:

Jun. 20, 2018
Applicant:

University of Science and Technology of China, Hefei, CN;

Inventors:

Yingqiu Dai, Anhui, CN;

Yunbin Zhu, Anhui, CN;

Xing Rong, Anhui, CN;

Jiangfeng Du, Anhui, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/032 (2006.01);
U.S. Cl.
CPC ...
G01R 33/032 (2013.01);
Abstract

A magnetic field measurement device and a magnetic field measurement method based on solid-state spins are provided. Zeeman splitting between electron energy levels of electrons of a magnetic sensitive unit is different under the action of external magnetic fields having different intensities. Continuous excitation and manipulation is applied to the electrons by means of a control field and control laser, so that spins of a system can reach a balanced state. The spin population of the system is influenced by the external magnetic fields. Therefore, fluorescence signals with intensities changing with the spin population of the system can be obtained, and fluorescent signals having different intensities can be obtained according to the different intensities of the external magnetic fields.


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