The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Apr. 30, 2018
Dow Global Technologies Llc, Midland, MI (US);
Rohm and Haas Company, Collegeville, PA (US);
Donald L. McCarty, II, Midland, MI (US);
Erick Sutanto, Collegeville, PA (US);
Larry Dotson, Midland, MI (US);
Brayden E. Glad, Lake Jackson, TX (US);
Hitendra Singh, Lake Jackson, TX (US);
John Lund, Midland, MI (US);
Dow Global Technologies LLC, Midland, MI (US);
Rohm and Haas Company, Collegeville, PA (US);
Abstract
A device for analyzing a physical characteristic of a film sample is described herein. The device includes a clamping system configured to hold the film sample. The device further includes a dart probe system configured to test a physical characteristic of the film sample. The dart probe system has a dart probe, a propulsion system configured to move the dart probe relative to the clamping system, and a force sensor configured to measure a force that the dart probe is subjected to during a movement of the dart probe. The force sensor is configured to measure a force imparted to the film sample when the dart probe comes in contact with the film sample.