The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Sep. 26, 2018
Applicant:
Phc Holdings Corporation, Tokyo, JP;
Inventors:
Hiroto Kawata, Ehime, JP;
Kazuya Kondoh, Ehime, JP;
Assignee:
PHC HOLDINGS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/75 (2006.01); G01N 35/00 (2006.01); B01L 3/00 (2006.01); G01N 33/543 (2006.01); G01N 21/64 (2006.01); G01N 21/76 (2006.01); G01N 21/66 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54373 (2013.01); B01L 3/502 (2013.01); B01L 3/5027 (2013.01); G01N 21/6428 (2013.01); G01N 21/66 (2013.01); G01N 21/75 (2013.01); G01N 21/76 (2013.01); G01N 33/54326 (2013.01); B01L 2200/12 (2013.01); B01L 2400/0409 (2013.01); G01N 2021/6439 (2013.01);
Abstract
A sample analysis device includes: a motor to rotate a sample analysis substrate with a sample introduced thereon around a rotation axis of the sample analysis substrate; a drive circuit to drive the motor; a photodetector to measure a number of photons associated with a luminescence from the sample being transmitted through a window of a measurement chamber of the sample analysis substrate; and a control circuit to calculate a measurement value of the luminescence of the sample by using a number of photons measured by the photodetector while the motor rotates the sample analysis substrate.