The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2022
Filed:
Dec. 13, 2018
Commissariat À L'énergie Atomique ET Aux Énergies Alternatives, Paris, FR;
Safran, Paris, FR;
Olivier Mesnil, Orsay, FR;
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, Paris, FR;
SAFRAN, Paris, FR;
Abstract
A device for imaging defects in a structure includes N transmitters and P receivers to be distributed over at least one surface of the structure and a central unit controlling the transmitters and receivers to sequentially record Q≤N×P signals (S) obtained from electrical signals provided by the receivers of Q different transmitter/receiver pairs, after reception of mechanical waves transmitted by the transmitters of these Q pairs. It further stores Q first and Q second corresponding reference signals (S, S), representative of the structure without defects and differing by random noise. A central processing unit is programmed to: correlate each signal obtained with the corresponding first reference signal, in such a way as to construct an image of probabilities of defects; correlate each first reference signal with the corresponding second reference signal, in such a way as to construct a reference noisy image; and subtract the reference noisy image from the image of probabilities of defects.